Electrical method to localize the high-resistance of nanoscale CoSi2 word-line for OTP memories. - Ming-Yi Lee; T.-Y. Chang; W.-F. Hsueh; Li-Kuang Kuo; Ding-Jhang Lin; Yen-Hai Chao; U. J. Tzeng; Chih-Yuan Lu (IRPS, 2018)