Progressively Censored Reliability Sampling Plans for the Weibull Distribution. - Uditha Balasooriya; Sutaip L. C. Saw; Veeresh Gadag (Technometrics, 2000)

Reliability sampling plans for lognormal distribution, based on progressively-censored samples. - Uditha Balasooriya; N. Balakrishnan 002 (IEEE Trans. Reliab., 2000)

Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. - Uditha Balasooriya; Chan-Kee Low (IEEE Trans. Reliab., 2004)