Accelerated test pattern generation by cone-oriented circuit partitioning. - Torsten Grüning; Udo Mahlstedt; Wilfried Daehn; Cengiz Özcan (EURO-DAC, 1990)

Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. - Udo Mahlstedt; Torsten Grüning; Cengiz Özcan; Wilfried Daehn (ICCAD, 1990)

DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. - Torsten Grüning; Udo Mahlstedt; Hartmut Koopmeiners (ICCAD, 1991)

Test generation for IDDQ testing and leakage fault detection in CMOS circuits. - Udo Mahlstedt; Matthias Heinitz; Jürgen Alt (EURO-DAC, 1992)

DELTEST: Deterministic Test Generation for Gate-Delay Faults. - Udo Mahlstedt (ITC, 1993)

Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. - Udo Mahlstedt; Jürgen Alt (ITC, 1993)

Simulation of non-classical faults on the gate level-fault modeling. - Jürgen Alt; Udo Mahlstedt (VTS, 1993)

Deterministic test generation for non-classical faults on the gate level. - Udo Mahlstedt; Jürgen Alt; Ingo Hollenbeck (Asian Test Symposium, 1995)

CURRENT: a test generation system for IDDQ testing. - Udo Mahlstedt; Jürgen Alt; Matthias Heinitz (VTS, 1995)