Intelligent Solenoid Pump Fault Detection based on MFCC Features, LLE and SVM*. - Ugochukwu Ejike Akpudo; Jang-Wook Hur (ICAIIC, 2020)

A Multi-Domain Diagnostics Approach for Solenoid Pumps Based on Discriminative Features. - Ugochukwu Ejike Akpudo; Hur Jang-Wook (IEEE Access, 2020)

An Automated Sensor Fusion Approach for the RUL Prediction of Electromagnetic Pumps. - Ugochukwu Ejike Akpudo; Hur Jang-Wook (IEEE Access, 2021)

Exploring the Efficiencies of Spectral Isolation for Intelligent Wear Monitoring of Micro Drill Bit Automatic Regrinding In-Line Systems. - Ugochukwu Ejike Akpudo; Jang-Wook Hur (Algorithms, 2022)

A Cost-Efficient MCSA-Based Fault Diagnostic Framework for SCIM at Low-Load Conditions. - Chibuzo Nwabufo Okwuosa; Ugochukwu Ejike Akpudo; Jang-Wook Hur (Algorithms, 2022)

What EXACTLY are We Looking at?: Investigating for Discriminance in Ultra-Fine-Grained Visual Categorization Tasks. - Ugochukwu Ejike Akpudo; Xiaohan Yu 001; Jun Zhou 001; Yongsheng Gao 001 (DICTA, 2023)

NCAF: NTD-based Concept Activation Factorisation Framework for CNN Explainability. - Ugochukwu Ejike Akpudo; Xiaohan Yu 001; Jun Zhou 001; Yongsheng Gao 001 (IVCNZ, 2023)

Coherentice: Invertible Concept-Based Explainability Framework for CNNs beyond Fidelity. - Ugochukwu Ejike Akpudo; Yongsheng Gao 001; Jun Zhou 001; Andrew Lewis (ICME, 2024)

TraNCE: Transformative Non-linear Concept Explainer for CNNs. - Ugochukwu Ejike Akpudo; Yongsheng Gao 001; Jun Zhou 001; Andrew Lewis (CoRR, 2025)

Visual Explanation via Similar Feature Activation for Metric Learning. - Yi Liao; Ugochukwu Ejike Akpudo; Jue Zhang; Yongsheng Gao 001; Jun Zhou 001; Wenyi Zeng; Weichuan Zhang (CoRR, 2025)

TraNCE: Transformative Nonlinear Concept Explainer for CNNs. - Ugochukwu Ejike Akpudo; Yongsheng Gao 001; Jun Zhou 001; Andrew Lewis (IEEE Trans. Neural Networks Learn. Syst., 2025)

CoPISan: Contrastive Perceptual Inference and Sanity Checks for Concept-Based CNN Explanations. - Ugochukwu Ejike Akpudo; Yongsheng Gao 001; Jun Zhou 001; Andrew Lewis (IEEE Trans. Pattern Anal. Mach. Intell., 2025)