A systematic study of gate dielectric TDDB in FinFET technology. - Hyunjin Kim; Minjung Jin; Hyun-Chul Sagong; Jinju Kim; Ukjin Jung; Minhyuck Choi; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2018)

Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology. - Seongkyung Kim; Ukjin Jung; Seungjin Choo; Kihyun Choi; Tae-Jin Chung; Shin-Young Chung; Euncheol Lee; Juhun Park; Deokhan Bae; Myungyoon Um (IRPS, 2022)

Modeling and Dynamic Radar Cross-Section Estimation of Chaff Clouds for Real-Time Simulation. - Jun-Seon Kim; Ukjin Jung; Su-Hong Park; Dong-Yeob Lee; Moonhong Kim; Dongwoo Sohn; Dong-Wook Seo (Remote. Sens., 2023)