Evaluation of error detection schemes using fault injection by heavy-ion radiation. - Ulf Gunneflo; Johan Karlsson; Jan Torin (FTCS, 1989)

The Effects of Heavy-Ion Induced Single Event Upsets in the MC6809E Microprocessor. - Johan Karlsson; Ulf Gunneflo; Jan Torin (Fehlertolerierende Rechensysteme, 1989)

Two Fault Injection Techniques for Test of Fault Handling Mechanisms. - Johan Karlsson; Ulf Gunneflo; Peter Lidén; Jan Torin (ITC, 1991)

Two Software Techniques for On-line Error Detection. - Seyed Ghassem Miremadi; Johan Karlsson; Ulf Gunneflo; Jan Torin (FTCS, 1992)

A Study of the Effects of Transient Fault Injection into a 32-bit RISC with Built-in Watchdog. - Joakim Ohlsson; Marcus Rimén; Ulf Gunneflo (FTCS, 1992)

Using heavy-ion radiation to validate fault-handling mechanisms. - Johan Karlsson; Peter Lidén; Peter Dahlgren; Rolf Johansson 002; Ulf Gunneflo (IEEE Micro, 1994)