SCR operation mode of diode strings for ESD protection. - Ulrich Glaser; Kai Esmark; Martin Streibl; Christian Russ; Krzysztof Domanski; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2007)

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. - Michael Heer; Krzysztof Domanski; Kai Esmark; Ulrich Glaser; Dionyz Pogany; Erich Gornik; Wolfgang Stadler (Microelectron. Reliab., 2009)