Mismatch effects explained by the spectral model [MOS devices]. - Jürgen Oehm; Ulrich Grünebaum; Klaus Schumacher (ICECS, 1999)

A physical approach to mismatch modelling and parameter correlations. - Jürgen Oehm; Ulrich Grünebaum; Klaus Schumacher (ISCAS, 2000)