National standards and standard measurement systems for impedance and reflection coefficient. - Algirgas P. Jurkus; Ulrich Stumper (Proc. IEEE, 1986)

Extended cross-ratio reflection correction at microwave frequencies using waveguide air-lines. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2001)

Efficient broadband method for equivalent source reflection coefficient measurements. - Andras Török; Dieter Janik; Wolfgang Peinelt; Dieter Stumpe; Ulrich Stumper (IEEE Trans. Instrum. Meas., 2001)

Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2003)

Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2005)

Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2007)

Influence of Nonideal Calibration Items on S-Parameter Uncertainties Applying the SOLR Calibration Method. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2009)

Measurement of a Microwave Load Using One or Two Terminations of Known Reflection. - Ulrich Stumper (IEEE Trans. Instrum. Meas., 2011)

Influence of Different Configurations of Nonideal Calibration Standards on Vector Network Analyzer Performance. - Ulrich Stumper; Thorsten Schrader (IEEE Trans. Instrum. Meas., 2012)

Calibration Method for Vector Network Analyzers Using One or Two Known Reflection Standards. - Ulrich Stumper; Thorsten Schrader (IEEE Trans. Instrum. Meas., 2014)

Reflection Measurement of Low-Reflective Loads at Millimeter Waves. - Ulrich Stumper; Thorsten Schrader; Rolf H. Judaschke (IEEE Trans. Instrum. Meas., 2016)