Automated formal verification of X propagation with respect to testability issues. - Mehdi Dehbashi; Daniel Tille; Ulrike Pfannkuchen; Stephan Eggersglüß (IDT, 2014)

Automated Optimization of Scan Chain Structure for Test Compression-Based Designs. - Harshad Dhotre; Mehdi Dehbashi; Ulrike Pfannkuchen; Klaus Hofmann (ATS, 2016)

Machine learning based test pattern analysis for localizing critical power activity areas. - Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler (DFT, 2017)

A lightweight X-masking scheme for IoT designs. - Daniel Tille; Benedikt Gottinger; Ulrike Pfannkuchen (ITC-Asia, 2017)

On enabling diagnosis for 1-Pin Test fails in an industrial flow. - Daniel Tille; Benedikt Gottinger; Ulrike Pfannkuchen; Helmut Graeb; Ulf Schlichtmann (ASP-DAC, 2018)

Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing. - Harshad Dhotre; Stephan Eggersglüß; Rolf Drechsler; Mehdi Dehbashi; Ulrike Pfannkuchen (DDECS, 2018)

IJTAG Through a Two-Pin Chip Interface. - Manu Baby; Bernd Büttner; Piet Engelke; Ulrike Pfannkuchen; Reinhard Meier; Jonathan Gaudet; Jean-François Côté; Givargis Danialy 001; Martin Keim; Lori Schramm (ITC, 2020)