Technology scaling effects on SRAM-PUF reliability under ionizing radiation. - Umeshwarnath Surendranathan; Horace Wilson; Biswajit Ray (DRC, 2023)

Technology Scaling Effects on SRAM Data Remanence. - Umeshwarnath Surendranathan; Farzana Hoque; Aleksandar Milenkovic; Biswajit Ray (DRC, 2024)