Emitter-Base Profile Optimization of SiGe HBTs for Improved Thermal Stability and Frequency Response at Low-Bias Currents. - Uppili S. Raghunathan; Brian R. Wier; Zachary E. Fleetwood; Michael A. Oakley; Vibhor Jain; John D. Cressler (BCICTS, 2018)

Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. - Brian R. Wier; Rafael Perez Martinez; Uppili S. Raghunathan; Hanbin Ying; Saeed Zeinolabedinzadeh; John D. Cressler (BCICTS, 2018)

Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown. - Rafael Perez Martinez; Uppili S. Raghunathan; Brian R. Wier; Harrison P. Lee; John D. Cressler (BCICTS, 2019)

DC and RF Variability of SiGe HBTs Operating Down to Deep Cryogenic Temperatures. - Hanbin Ying; Jeffrey W. Teng; George N. Tzintzarov; Anup P. Omprakash; Sunil G. Rao; Uppili S. Raghunathan; Adrian Ildefonso; Martin S. Fernandez; John D. Cressler (BCICTS, 2019)

Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs. - Uppili S. Raghunathan; Pui Yee; Dave Brochu; Vibhor Jain; Harrison P. Lee; John D. Cressler; Dimitris P. Ioannou (BCICTS, 2020)

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. - Dimitris P. Ioannou; Uppili S. Raghunathan; Dave Brochu; Adam W. DiVergilio; Vibhor Jain; John J. Pekarik (BCICTS, 2021)

Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications. - Ajay Raman; Vibhor Jain; Elanchezhian Veeramani; Beng Woon Lim; Uppili S. Raghunathan; Yves Ngu; Alvin Joseph (BCICTS, 2021)

SiGe HBTs for Power Amplifiers in Front-End of Radio Communication Systems. - Alvin J. Joseph; Vibhor Jain; John J. Pekarik; Ajay Raman; Shafi Syed; Liu Hang; Ned Cahoon; Randy Wolf; Venkat Vanukuru; Elan Veeramani; Beng Woon Lim; Uppili S. Raghunathan; et al. (BCICTS, 2022)

Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz. - Uppili S. Raghunathan; Saurabh Sirohi; Vaibhav Ruparelia; Prateek Kumar Sharma; Dimitris P. Ioannou; Vibhor Jain; H. K. Kakara; S. Gedela; Venkat Vanukuru; P. Dongmo; C. Luce; R. Hazbun; et al. (BCICTS, 2022)

Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs. - Dimitris P. Ioannou; Ephrem G. Gebreselasie; Vinh Pham; Uppili S. Raghunathan (BCICTS, 2023)

The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. - Harrison P. Lee; Nelson Sepúlveda-Ramos; Jeffrey W. Teng; Jackson P. Moody; Delgermaa Nergui; Brett L. Ringel; Zachary R. Brumbach; Alizeh Premani; Uppili S. Raghunathan; Vibhor Jain; John D. Cressler (BCICTS, 2023)

Design Trade-offs between Series-Peaking Inductor and High $f_T$ SiGe HBTs in Transimpedance Amplifiers. - Prateek Kumar Sharma; Vaibhav Ruparelia; Saurabh Sirohi; Uppili S. Raghunathan; Venkat Vanukuru; Vibhor Jain (BCICTS, 2023)