Test scheduling for modular SOCs in an abort-on-fail environment. - Urban Ingelsson; Sandeep Kumar Goel; Erik Larsson; Erik Jan Marinissen (ETS, 2005)

Resistive Bridging Faults DFT with Adaptive Power Management Awareness. - Urban Ingelsson; Paul M. Rosinger; S. Saqib Khursheed; Bashir M. Al-Hashimi; Peter Harrod (ATS, 2007)

Variation Aware Analysis of Bridging Fault Testing. - Urban Ingelsson; Bashir M. Al-Hashimi; Peter Harrod (ATS, 2008)

Bridging Fault Test Method With Adaptive Power Management Awareness. - S. Saqib Khursheed; Urban Ingelsson; Paul M. Rosinger; Bashir M. Al-Hashimi; Peter Harrod (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Process Variation-Aware Test for Resistive Bridges. - Urban Ingelsson; Bashir M. Al-Hashimi; S. Saqib Khursheed; Sudhakar M. Reddy; Peter Harrod (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Efficient Embedding of Deterministic Test Data. - Mudassar Majeed; Daniel Ahlstrom; Urban Ingelsson; Gunnar Carlsson; Erik Larsson (Asian Test Symposium, 2010)

Test Time Analysis for IEEE P1687. - Farrokh Ghani Zadegan; Urban Ingelsson; Gunnar Carlsson; Erik Larsson (Asian Test Symposium, 2010)

Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing. - Dimitar Nikolov; Urban Ingelsson; Virendra Singh; Erik Larsson (DELTA, 2010)

Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. - Farrokh Ghani Zadegan; Urban Ingelsson; Golnaz Asani; Gunnar Carlsson; Erik Larsson (Asian Test Symposium, 2011)

Design automation for IEEE P1687. - Farrokh Ghani Zadegan; Urban Ingelsson; Gunnar Carlsson; Erik Larsson (DATE, 2011)

Measurement point selection for in-operation wear-out monitoring. - Urban Ingelsson; Shih-Yen Chang; Erik Larsson (DDECS, 2011)

Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization. - Dimitar Nikolov; Urban Ingelsson; Virendra Singh; Erik Larsson (DSN Workshops, 2011)

Investigation into voltage and process variation-aware manufacturing test. - Urban Ingelsson; Bashir M. Al-Hashimi (ITC, 2011)

Test tool qualification through fault injection. - Q. Wang; Andreas Wallin; Viacheslav Izosimov; Urban Ingelsson; Zebo Peng (ETS, 2012)

Requirement Decomposition and Testability in Development of Safety-Critical Automotive Components, . - Viacheslav Izosimov; Urban Ingelsson; Andreas Wallin (SAFECOMP, 2012)

Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias. - Breeta SenGupta; Urban Ingelsson; Erik Larsson (VLSI Design, 2012)

Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687. - Farrokh Ghani Zadegan; Urban Ingelsson; Erik Larsson; Gunnar Carlsson (IEEE Des. Test Comput., 2012)

Scheduling Tests for 3D Stacked Chips under Power Constraints. - Breeta SenGupta; Urban Ingelsson; Erik Larsson (J. Electron. Test., 2012)

Access Time Analysis for IEEE P1687. - Farrokh Ghani Zadegan; Urban Ingelsson; Gunnar Carlsson; Erik Larsson (IEEE Trans. Computers, 2012)

Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687. - Kim Petersén; Dimitar Nikolov; Urban Ingelsson; Gunnar Carlsson; Farrokh Ghani Zadegan; Erik Larsson (IOLTS, 2014)

Collaborative Development of Safety-Critical Automotive Systems: Exchange, Views and Metrics. - Johan Ekberg; Urban Ingelsson; Henrik Lönn; Magnus Skoog; Jan Söderberg (SAFECOMP Workshops, 2014)

Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems. - Dimitar Nikolov; Urban Ingelsson; Virendra Singh; Erik Larsson (Microelectron. Reliab., 2014)

Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption. - Urban Ingelsson; Sandeep Kumar Goel; Erik Larsson; Erik Jan Marinissen (IEEE Trans. Computers, 2015)

Addressing Model Complexity in Automotive System Development - Selection of System Model Elements for Allocation of Requirements. - Grischa Liebel; Andreea Olaru; Henrik Lönn; Henrik Kaijser; Sunith Rajendran; Urban Ingelsson; Richard Berntsson-Svensson (MODELSWARD, 2016)

Test Planning for Core-based Integrated Circuits under Power Constraints. - Breeta SenGupta; Dimitar Nikolov; Urban Ingelsson; Erik Larsson (J. Electron. Test., 2017)