Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. - Urban Kovac; Dave Reid; Campbell Millar; Gareth Roy; Scott Roy; Asen Asenov (Microelectron. Reliab., 2008)

Modeling and simulation of transistor and circuit variability and reliability. - Asen Asenov; Binjie Cheng; Daryoosh Dideban; Urban Kovac; Negin Moezi; Campbell Millar; Gareth Roy; Andrew R. Brown; Scott Roy (CICC, 2010)