Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM. - Linda M. Geppert; Urs Bapst; David F. Heidel; Keith A. Jenkins (IEEE J. Solid State Circuits, 1991)

A 5.9mW/Gb/s 7Gb/s/pin 8-lane single-ended RX with crosstalk cancellation scheme using a XCTLE and 56-tap XDFE in 32nm SOI CMOS. - Alessandro Cevrero; Cosimo Aprile; Pier Andrea Francese; Urs Bapst; Christian Menolfi; Matthias Braendli; Marcel A. Kossel; Thomas Morf; Lukas Kull; Hazar Yueksel; Ilter Oezkaya; Yusuf Leblebici; et al. (VLSIC, 2015)