Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown. - Joachim C. Reiner; Philippe Gasser; Urs Sennhauser (Microelectron. Reliab., 2002)

A laser-based instrument for measuring strain in electronic packages using coherent fibre-bundles. - Peter Dias-Lalcaca; Erwin Hack; Filippo Visintainer; Stefano Bernard; Urs Sennhauser (Microelectron. Reliab., 2004)

Gallium Artefacts on FIB-milled Silicon Samples. - Joachim C. Reiner; Philipp Nellen; Urs Sennhauser (Microelectron. Reliab., 2004)

Connection availability analysis of span-restorable mesh networks. - Ling Zhou; Marcel Held; Urs Sennhauser (Photonic Netw. Commun., 2007)

Estimation of affine transformations directly from tomographic projections in two and three dimensions. - René Mooser; Fredrik Forsberg; Erwin Hack; Gábor Székely; Urs Sennhauser (Mach. Vis. Appl., 2013)