Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. - Mohamed Lamhamdi; Patrick Pons; Usama Zaghloul; Laurent Boudou; Fabio Coccetti; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. - Usama Zaghloul; George J. Papaioannou; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2009)

Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. - Usama Zaghloul; Matroni Koutsoureli; H. Wang; Fabio Coccetti; George J. Papaioannou; Patrick Pons; Robert Plana (Microelectron. Reliab., 2010)

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)

Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. - Usama Zaghloul; George J. Papaioannou; Bharat Bhushan; Fabio Coccetti; Patrick Pons; Robert Plana (Microelectron. Reliab., 2011)