Combined Impact of NBTI Aging and Process Variations on Noise Margins of Flip-Flops. - Usman Khalid; Antonio Mastrandrea; Mauro Olivieri (DSD, 2014)

The Impact of Sensitive Inputs on the Reliability of Nanoscale Circuits. - Usman Khalid; Jahanzeb Anwer; Nor Hisham Hamid; Vijanth S. Asirvadam (Computational Intelligence in Digital and Network Designs and Applications, 2015)

Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops. - Usman Khalid; Antonio Mastrandrea; Mauro Olivieri (Microelectron. Reliab., 2015)

Characterizing noise pulse effects on the power consumption of idle digital cells. - Mauro Olivieri; Usman Khalid; Antonio Mastrandrea; Francesco Menichelli (ISCAS, 2018)

Sensor virtualization Middleware design for Ambient Assisted Living based on the Priority packet processing. - Zubair Khalid; Usman Khalid; Mohd Adib Sarijari; Hashim Safdar; Rahat Ullah; Mohsin Qureshi; Shafiq Ur Rehman (ANT/EDI40, 2019)

Motivating Medical Students Using Virtual Reality Based Education. - Mian Usman Sattar; Sellappan Palaniappan; Asiah Lokman; Nauman Shah; Usman Khalid; Raza Hasan (Int. J. Emerg. Technol. Learn., 2020)