The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures. - Klaus Thonke; Martin Schirra; Raoul Schneider; Anton Reiser; Günther M. Prinz; Martin Feneberg; Johannes Biskupek; Ute Kaiser; Rolf Sauer (Microelectron. J., 2009)