Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm. - Uwe Brand; Min Xu; Lutz Doering; Jannick Langfahl-Klabes; Heinrich Behle; Sebastian Bütefisch; Thomas Ahbe; Erwin Peiner; Stefan Völlmeke; Thomas Frank; Bodo Mickan; Ilia Kiselev; et al. (Sensors, 2019)

Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing Platform. - Zhi Li 089; Sai Gao; Uwe Brand; Karla Hiller; Susann Hahn; Gerry Hamdana; Erwin Peiner; Helmut Wolff; Detlef Bergmann (Sensors, 2019)

The Status of PTB's Nanonewton Force Facility. - Vladimir Nesterov; Daniel Nies; Oleg Belai; Sebastian Bütefisch; Jürgen Kirchhoff; Michael Mueller; Uwe Brand (IEEE Trans. Instrum. Meas., 2019)

In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes. - Linus Teir; Tuomas Lindstedt; Thomas Widmaier; Björn Hemming; Uwe Brand; Michael Fahrbach; Erwin Peiner; Antti Lassila (Sensors, 2021)

Investigating the Trackability of Silicon Microprobes in High-Speed Surface Measurements. - Min Xu; Zhi Li 089; Michael Fahrbach; Erwin Peiner; Uwe Brand (Sensors, 2021)

Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements. - Min Xu; Ziqi Zhou; Thomas Ahbe; Erwin Peiner; Uwe Brand (Sensors, 2022)

Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography (Data). - Michael Fahrbach; Min Xu; Wilson Ombati Nyang'au; Oleg Domanov; Christian H. Schwalb; Zhi Li 089; Christian Kuhlmann 003; Uwe Brand; Erwin Peiner (Zenodo, 2023)

Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography. - Michael Fahrbach; Min Xu; Wilson Ombati Nyang'au; Oleg Domanov; Christian H. Schwalb; Zhi Li 089; Christian Kuhlmann 003; Uwe Brand; Erwin Peiner (Sensors, 2023)