Fehlererkennung und Fehlertoleranz beim assoziativen RAM(ARAM)-Speicher. - Uwe Gläser; U. Steinhausen (Fehlertolerierende Rechensysteme, 1989)

MILEF: an efficient approach to mixed level automatic test pattern generation. - Uwe Gläser; Heinrich Theodor Vierhaus (EURO-DAC, 1992)

Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. - Uwe Gläser; Uwe Hübner; Heinrich Theodor Vierhaus (ITC, 1992)

CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects. - Heinrich Theodor Vierhaus; Wolfgang Meyer 002; Uwe Gläser (ITC, 1993)

Fault behavior and testability of asynchronous CMOS circuits. - Heinrich Theodor Vierhaus; Wolfgang Meyer 002; Uwe Gläser; Raul Camposano (Microprocess. Microprogramming, 1993)

Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. - Uwe Gläser; Heinrich Theodor Vierhaus; M. Kley; A. Wiederhold (ICCAD, 1994)

Testability Analysis for Test Generation in Synchronous Sequential Circuits. - R. Wolber; Uwe Gläser; Heinrich Theodor Vierhaus (ICCD, 1994)

Mehrebenen-Testgenerierung für synchrone Schaltwerke. - Uwe Gläser (1994)

Logic optimization by an improved sequential redundancy addition and removal techniques. - Uwe Gläser; Kwang-Ting Cheng (ASP-DAC, 1995)

Gate delay fault test generation for non-scan circuits. - G. Van Brakel; Uwe Gläser; Hans G. Kerkhoff; Heinrich Theodor Vierhaus (ED&TC, 1995)

Systems Level Specification and Modeling of Reactive Systems: Concepts, Methods, and Tools. - Uwe Gläser (EUROCAST, 1995)

FOGBUSTER: an efficient algorithm for sequential test generation. - Uwe Gläser; Heinrich Theodor Vierhaus (EURO-DAC, 1995)

Improving topological ATPG with symbolic techniques. - Fulvio Corno; Paolo Prinetto; Matteo Sonza Reorda; Uwe Gläser; Heinrich Theodor Vierhaus (VTS, 1995)

An ATPG-Based Framework for Verifying Sequential Equivalence. - Shi-Yu Huang; Kwang-Ting Cheng; Kuang-Chien Chen; Uwe Gläser (ITC, 1996)

Automatic Test Pattern Generation with Optimal Load Balancing. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (PVM, 1996)

Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. - Uwe Gläser; Heinrich Theodor Vierhaus (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996)

An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (Great Lakes Symposium on VLSI, 1997)

A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (PARCO, 1997)

The Impact of Area Optimization for the Power Consumption of Controllers. - H.-Ch. Dahmen; Uwe Gläser (EUROMICRO, 1998)

Modell Evaluation Using Genetic Manipulation Techniques. - H.-Ch. Dahmen; Uwe Gläser; Zoran Stamenkovic (Great Lakes Symposium on VLSI, 1999)

SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information. - Fulvio Corno; Uwe Gläser; Paolo Prinetto; Matteo Sonza Reorda; Heinrich Theodor Vierhaus; Massimo Violante (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)