Impact of back side circuit edit on active device performance in bulk silicon ICs. - Uwe Kerst; Rudolf Schlangen; A. Kabakow; Erwan Le Roy; Ted R. Lundquist; Siegfried Pauthner (ITC, 2005)

Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. - Rudolf Schlangen; Uwe Kerst; A. Kabakow; Christian Boit (Microelectron. Reliab., 2005)

Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. - Rudolf Schlangen; Peter Sadewater; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2006)

Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)

Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. - Rudolf Schlangen; Uwe Kerst; Christian Boit; Tahir Malik; Rajesh Jain; Ted R. Lundquist (Microelectron. Reliab., 2007)

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. - Christian Boit; Rudolf Schlangen; Uwe Kerst; Ted R. Lundquist (IEEE Des. Test Comput., 2008)

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. - Ulrike Kindereit; Christian Boit; Uwe Kerst; Steven Kasapi; Radu Ispasoiu; Roy Ng; William K. Lo (Microelectron. Reliab., 2008)

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Ted R. Lundquist; Peter Egger; Christian Boit (Microelectron. Reliab., 2009)

Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC. - Mahyar Boostandoost; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2010)

Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. - Philipp Scholz; Christian Gallrapp; Uwe Kerst; Ted R. Lundquist; Christian Boit (Microelectron. Reliab., 2010)

On charge sensors for FIB attack detection. - Clemens Helfmeier; Christian Boit; Uwe Kerst (HOST, 2012)

Security Risks Posed by Modern IC Debug and Diagnosis Tools. - Christian Boit; Clemens Helfmeier; Uwe Kerst (FDTC, 2013)

Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. - Philipp Scholz; Norbert Herfurth; Michael Sadowski; Ted R. Lundquist; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2014)

A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips. - Norman Dodel; Stefan Keil; Andreas Wiemhofer; Malte Kortstock; Philipp Scholz; Uwe Kerst; Roland Thewes (ESSCIRC, 2015)