Technologies and reliability of modern embedded flash cells. - Axel Sikora; Frank-Peter Pesl; Walter Unger; Uwe Paschen (Microelectron. Reliab., 2006)

Low-noise and large-area CMOS SPADs with timing response free from slow tails. - Danilo Bronzi; Federica A. Villa; Simone Bellisai; Bojan Markovic; Simone Tisa; Alberto Tosi; Franco Zappa; Sascha Weyers; Daniel Durini; Werner Brockherde; Uwe Paschen (ESSDERC, 2012)

Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps. - Andrei Schmidt; Stefan Dreiner; Holger Vogt; Uwe Paschen (ESSDERC, 2015)

High temperature SOI CMOS technology and circuit realization for applications up to 300°C. - Holger Kappert; Norbert Kordas; Stefan Dreiner; Uwe Paschen; Rainer Kokozinski (ISCAS, 2015)