Design of Low Voltage Tunneling-FET Logic Circuits Considering Asymmetric Conduction Characteristics. - Daniel H. Morris; Uygar E. Avci; Rafael Rios; Ian A. Young (IEEE J. Emerg. Sel. Topics Circuits Syst., 2014)

Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel's 10+ Process. - Cheyun Lin; Uygar E. Avci; M. A. Blount; Rohit Grover; Jeffery Hicks; R. Kasim; A. Kundu; C. M. Pelto; C. Ryder; Anthony Schmitz; K. Sethi; D. Seghete; et al. (IRPS, 2020)