Oversampling Based on Data Augmentation in Convolutional Neural Network for Silicon Wafer Defect Classification. - Uzma Batool; Mohd Ibrahim Shapiai; Nordinah Ismail; Hilman Fauzi; Syahrizal Salleh (SoMeT, 2020)

Skeleton-Based Action Recognition with Joint Coordinates as Feature Using Neural Oblivious Decision Ensembles. - Fakhrul Aniq Hakimi Nasrul 'Alam; Mohd Ibrahim Shapiai; Uzma Batool; Ahmad Kamal Ramli; Khairil Ashraf Elias (SoMeT, 2021)

Incorporating Attention Mechanism in Enhancing Classification of Alzheimer's Disease. - Nur Amirah Abd Hamid; Mohd Ibrahim Shapiai; Uzma Batool; Ranjit Singh Sarban Singh; Muhamad Kamal Mohammed Amin; Khairil Ashraf Elias (SoMeT, 2021)

A Systematic Review of Deep Learning for Silicon Wafer Defect Recognition. - Uzma Batool; Mohd Ibrahim Shapiai; Muhammad Tahir; Zool Hilmi Ismail; Noor Jannah Zakaria; Ahmed Elfakharany (IEEE Access, 2021)

An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification. - Uzma Batool; Mohd Ibrahim Shapiai; Salama A. Mostafa; Mohd Zamri Ibrahim (IEEE Access, 2023)