Defects in silicon oxynitride gate dielectric films. - Hei Wong; V. A. Gritsenko (Microelectron. Reliab., 2002)

Onefold coordinated oxygen atom: an electron trap in the silicon oxide. - V. A. Gritsenko; A. V. Shaposhnikov; Yu. N. Novikov; A. P. Baraban; Hei Wong; G. M. Zhidomirov; M. Roger (Microelectron. Reliab., 2003)

Modeling the charge transport mechanism in amorphous Al2O3 with multiphonon trap ionization effect. - Yu. N. Novikov; A. V. Vishnyakov; V. A. Gritsenko; K. A. Nasyrov; Hei Wong (Microelectron. Reliab., 2010)