Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. - V. A. Niranjan; Deepika Neethirajan; Constantinos Xanthopoulos; E. De La Rosa; C. Alleyne; S. Mier; Yiorgos Makris (VTS, 2021)

Machine Learning-Based Overkill Reduction through Inter-Test Correlation. - Deepika Neethirajan; V. A. Niranjan; Richard Willis; Amit Nahar; D. Webster; Yiorgos Makris (VTS, 2022)

Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. - V. A. Niranjan; Deepika Neethirajan; Constantinos Xanthopoulos; D. Webster; Amit Nahar; Yiorgos Makris (VTS, 2023)