Influence of the annealing temperature on the IR properties of SiO2 films grown from SiH4+O2. - V. Em. Vamvakas; D. Davazoglou (Microelectron. Reliab., 2005)

Correlation between infrared transmission spectra and the interface trap density of SiO2 films. - V. Em. Vamvakas; M. Theodoropoulou; Stavroula N. Georga; Christoforos A. Krontiras; M. N. Pisanias (Microelectron. Reliab., 2007)