Insight Into HCI Reliability on I/O Nitrided Devices. - C. Doyen; V. Yon; Xavier Garros; Luigi Basset; Tadeu Mota Frutuoso; C. Dagon; Cheikh Diouf; X. Federspiel; V. Millon; Frederic Monsieur; C. Pribat; David Roy 001 (IRPS, 2023)

A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications. - Pascal Chevalier 002; Florian Cacho; C. Durand; N. Derrier; V. Millon; Frederic Monsieur; A. Gauthier; P. Billy; Sébastien Fregonese; Thomas Zimmer; H. Audouin; Michel Buczko; et al. (BCICTS, 2024)