Experimental Results for Self-Dual Multi-Output Combinational Circuits. - Vladimir V. Saposhnikov; V. Moshanin; Valerij V. Saposhnikov; Michael Gössel (J. Electron. Test., 1999)

New Self-dual Circuits for Error Detection and Testing. - Alexej Dmitriev; Valerij V. Saposhnikov; Vladimir V. Saposhnikov; Michael Gössel; V. Moshanin; Andrej A. Morosov (VLSI Design, 2000)