Diagnosing Multiple Bridge Faults in Baseline Multistage Interconnection Networks. - V. Purohit; Fabrizio Lombardi; Susumu Horiguchi; J. H. Kim (ICPP (1), 1995)

Characterization and modeling of hot carrier injection in LDMOS for L-band radar application. - Loïc Lachèze; Olivier Latry; Pascal Dherbécourt; Karine Mourgues; V. Purohit; Hichame Maanane; Jean Pierre Sipma; F. Cornu; Philippe Eudeline (Microelectron. Reliab., 2011)