S3: The IBM Smart Surveillance System: From Transactional Systems to Observational Systems. - Arun Hampapur; Sergio Borger; Lisa M. Brown; Christopher R. Carlson; Jonathan H. Connell; Max Lu; Andrew W. Senior; V. Reddy; Chiao-Fe Shu; Ying-li Tian (ICASSP (4), 2007)

Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation. - S. Chakravarthi; A. T. Krishnan; V. Reddy; S. Krishnan (Microelectron. Reliab., 2007)

OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review. - Dhanoop Varghese; V. Reddy; S. Krishnan; Muhammad Ashraful Alam (Microelectron. Reliab., 2014)