Optimizing Memory Tests by Analyzing Defect Coverage. - Alvin Jee; Jonathon E. Colburn; V. Swamy Irrinki; Mukesh Puri (MTDT, 2000)

Detection of Inter-Port Faults in Multi-Port Static RAMs. - Jun Zhao 005; V. Swamy Irrinki; Mukesh Puri; Fabrizio Lombardi (VTS, 2000)

Testing SRAM-Based Content Addressable Memories. - Jun Zhao 005; V. Swamy Irrinki; Mukesh Puri; Fabrizio Lombardi (IEEE Trans. Computers, 2000)

A Parallel Approach for Testing Multi-Port Static Random Access Memories. - Farzin Karimi; Fabrizio Lombardi; V. Swamy Irrinki; T. Crosby (MTDT, 2001)

Parallel testing of multi-port static random access memories. - Farzin Karimi; V. Swamy Irrinki; T. Crosby; Nohpill Park; Fabrizio Lombardi (Microelectron. J., 2003)