Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs. - V. Velayudhan; Francisco Gámiz; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2013)

Threshold voltage and on-current Variability related to interface traps spatial distribution. - V. Velayudhan; Javier Martín-Martínez; Marc Porti; Carlos Couso; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Carlos Marquez; Francisco Gámiz (ESSDERC, 2015)