Evolutionary approach to test generation of sequential digital circuits with multiple observation time strategy. - Yuriy A. Skobtsov; V. Y. Skobtsov (EWDTS, 2010)

Evolutionary Approach to Test Generation for Functional BIST - Yuriy A. Skobtsov; D. E. Ivanov; V. Y. Skobtsov; Raimund Ubar; Jaan Raik (CoRR, 2010)