A graph based approach for reliability analysis of nano-scale VLSI logic circuits. - Vahid Hamiyati Vaghef; Ali Peiravi (Microelectron. Reliab., 2014)

Node-to-node error sensitivity analysis using a graph based approach for VLSI logic circuits. - Vahid Hamiyati Vaghef; Ali Peiravi (Microelectron. Reliab., 2015)