Single Event Transient injection in large mixed-signal circuits. - Valentin Gutierrez; Gildas Léger (DCIS, 2018)

SET sensitivity evaluation, a comparison before and after layout. - Valentin Gutierrez; Gildas Léger (DCIS, 2019)

1 Adaptive defect simulation flow for Defect-oriented Test evaluation. - Valentin Gutierrez; Gildas Léger (SMACD, 2019)

On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. - Valentin Gutierrez; Gildas Léger (NEWCAS, 2020)

An adaptive simulation framework for AMS-RF test quality. - Valentin Gutierrez; Gildas Léger (Integr., 2020)

A methodology for defect detection in analog circuits based on causal feature selection. - Gildas Léger; Antonio J. Ginés; Valentin Gutierrez; Manuel J. Barragán (ICECS 2022, 2022)

A Single-Event Latchup setup for high-precision AMS circuits. - Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías; Valentin Gutierrez; Carlos M. Domínguez-Matas; Maria Angeles Jalón; L. Carranza (ETS, 2023)

Behavioral Model for High-Speed SAR ADCs With On-Chip References. - Carlos Manuel Domínguez-Matas; Antonio J. Ginés; Aránzazu Otín; Valentin Gutierrez; Gildas Léger; Eduardo J. Peralías (IEEE Trans. Very Large Scale Integr. Syst., 2023)

On the Validity of SEE Simulation for Rad-Hard Analog ASICs. - Valentin Gutierrez; Carlos M. Domínguez-Matas; Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías (IOLTS, 2025)