Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test. - A. Massenz; Marco Barbato; Valentina Giliberto; Benno Margesin; S. Colpo; Gaudenzio Meneghesso (Microelectron. Reliab., 2011)

Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation. - Giorgio De Pasquale; Marco Barbato; Valentina Giliberto; Gaudenzio Meneghesso; Aurelio Somà (Microelectron. Reliab., 2012)

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. - Alessandro Compagnin; Matteo Meneghini; Marco Barbato; Valentina Giliberto; Andrea Cester; Massimo Vanzi; Giovanna Mura; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2013)