An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. - Antonio Raffo; Valeria Di Giacomo; Pier Andrea Traverso; Alberto Santarelli; Giorgio Vannini (IEEE Trans. Instrum. Meas., 2009)

Electron device nonlinear modelling for microwave circuit design. - Valeria Di Giacomo (2009)