On the length of single dynamic tests for monotone Boolean functions. - Valery A. Vardanian (FCT, 1985)

On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions. - Valery A. Vardanian (VTS, 1994)

On the Complexity of Dynamic Tests for Logic Functions. - Valery A. Vardanian (Acta Cybern., 1994)

On completely robust path delay fault testable realization of logic functions. - Valery A. Vardanian (VTS, 1996)

Exact probabilistic analysis of error detection for parity checkers. - Valery A. Vardanian (VTS, 1997)

Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check. - Valery A. Vardanian; Liana B. Mirzoyan (DATE, 2000)

An Approach for Evaluation of Redunancy Analysis Algorithms. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (MTDT, 2001)

A March-Based Fault Location Algorithm for Static Random Access Memories. - Valery A. Vardanian; Yervant Zorian (MTDT, 2002)

Embedded Memory Reliability: The SER Challenge. - N. Derhacobian; Valery A. Vardanian; Yervant Zorian (MTDT, 2004)

A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (VTS, 2004)

SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. - Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IEEE Des. Test Comput., 2004)

Impact of Soft Error Challenge on SoC Design. - Yervant Zorian; Valery A. Vardanian; K. Aleksanyan; K. Amirkhanyan (IOLTS, 2005)

Minimal March Tests for Unlinked Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2005)

Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (DDECS, 2006)

Minimal March Tests for Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (ETS, 2006)

A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. - T. A. Gyonjyan; Gurgen Harutunyan; Valery A. Vardanian (MTDT, 2006)

Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2006)

A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (DDECS, 2007)

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (J. Electron. Test., 2007)

An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2008)

An efficient March test for detection of all two-operation dynamic faults from subclass Sav. - H. Avetisyan; Gurgen Harutyunyan; Valery A. Vardanian; Yervant Zorian (EWDTS, 2010)

A Robust Solution for Embedded Memory Test and Repair. - K. Darbinyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (Asian Test Symposium, 2011)

Generic BIST architecture for testing of content addressable memories. - Hayk T. Grigoryan; Gurgen Harutunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IOLTS, 2011)

Symmetry Measure for Memory Test and Its Application in BIST Optimization. - Gurgen Harutunyan; Aram Hakhumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (J. Electron. Test., 2011)

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Application of defect injection flow for fault validation in memories. - K. Amirkhanyan; A. Davtyan; Gurgen Harutyunyan; T. Melkumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

Impact of process variations on read failures in SRAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. - T. Melkumyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An effective solution for building memory BIST infrastructure based on fault periodicity. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (VTS, 2013)

Extending fault periodicity table for testing faults in memories under 20nm. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2014)

Fault modeling and test algorithm creation strategy for FinFET-based memories. - Gurgen Harutyunyan; Grigor Tshagharyan; Valery A. Vardanian; Yervant Zorian (VTS, 2014)

An efficient approach for memory repair by reducing the number of spares. - Vrezh Sargsyan; Valery A. Vardanian; Samvel K. Shoukourian; Yervant Zorian; Avetik Yessayan (EWDTS, 2015)

On a Method for Segmentation of Memory Instances with Row Redundancies. - Karen Amirkhanyan; Valery A. Vardanian (EWDTS, 2019)

An Approach for Increasing Memory Repair Efficiency. - Karen Amirkhanyan; A. Babayan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2024)

Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs. - Karen Amirkhanyan; Valery A. Vardanian; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)