Fourier method modeling of semiconductor devices. - Valery Axelrad (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Grid quality and its influence on accuracy and convergence in device simulation. - Valery Axelrad (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. - Valery Axelrad; Nicolas B. Cobb; M. O'Brien; Thuy Do; Tom Donnelly; Yuri Granik; Emile Y. Sahouria; Victor Boksha; Artur Balasinski (ISQED, 2000)

Design Strategies for ESD Protection in SOC. - Krzysztof Iniewski; Valery Axelrad; Andrei Shibkov; Artur Balasinski; Marek Syrzycki (IWSOC, 2004)

The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness. - Oleg Semenov; Hossein Sarbishaei; Valery Axelrad; Manoj Sachdev (Microelectron. Reliab., 2004)

3.125 Gb/s power efficient line driver with 2-level pre-emphasis and 2 kV HBM ESD protection. - Krzysztof Iniewski; Valery Axelrad; Andrei Shibkov; Artur Balasinski; Sebastian Magierowski; Rafal Dlugosz; Adam Dabrowski (ISCAS (2), 2005)

Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices. - Oleg Semenov; Hossein Sarbishaei; Valery Axelrad; Manoj Sachdev (Microelectron. J., 2006)

Design and simulation of ESD-resistant ICs. - Valery Axelrad (MIXDES, 2013)