Statistical prediction of circuit aging under process variations. - Wenping Wang 004; Vijay Reddy; Bo Yang; Varsha Balakrishnan; Srikanth Krishnan; Yu Cao 001 (CICC, 2008)

Optimized Circuit Failure Prediction for Aging: Practicality and Promise. - Mridul Agarwal; Varsha Balakrishnan; Anshuman Bhuyan; Kyunglok Kim; Bipul C. Paul; Wenping Wang 004; Bo Yang; Yu Cao 001; Subhasish Mitra (ITC, 2008)

A framework for estimating NBTI degradation of microarchitectural components. - Michael DeBole; Krishnan Ramakrishnan; Varsha Balakrishnan; Wenping Wang 004; Hong Luo; Yu Wang 002; Yuan Xie 001; Yu Cao 001; Narayanan Vijaykrishnan (ASP-DAC, 2009)

Circuit aging prediction for low-power operation. - Rui Zheng; Jyothi Velamala; Vijay Reddy; Varsha Balakrishnan; Evelyn Mintarno; Subhasish Mitra; Srikanth Krishnan; Yu Cao 001 (CICC, 2009)

On the efficacy of input Vector Control to mitigate NBTI effects and leakage power. - Yu Wang 002; Xiaoming Chen 003; Wenping Wang 004; Varsha Balakrishnan; Yu Cao 001; Yuan Xie 001; Huazhong Yang (ISQED, 2009)

New-Age: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components. - Michael DeBole; Krishnan Ramakrishnan; Varsha Balakrishnan; Wenping Wang 004; Hong Luo; Yu Wang 002; Yuan Xie 001; Yu Cao 001; Narayanan Vijaykrishnan (Int. J. Parallel Program., 2009)

Unconstrained Biometric Recognition: Summary of Recent SOCIA Lab. Research. - Varsha Balakrishnan (CoRR, 2020)