Nanometer resolution dynamic displacement measurement in industrial/high noise environments. - Tim John Joseph; Venkataraman Kartik (ICIT, 2016)

High-throughput shape classification using support vector machine. - Pranav Lad; Abhijeet Somani; K. Eswara Krishnan; Abhishek Gupta; Venkataraman Kartik (ICIT, 2016)

Achieving Low-Noise, High-Bandwidth, Nanoscale-Resolution Position Sensing With GMR Sensors. - Tim John Joseph; Venkataraman Kartik (IEEE Trans. Instrum. Meas., 2023)

Magnetic Induction-Based Planar Displacement Sensing With Sub-Micrometer Resolution. - Abhilash Patel; Venkataraman Kartik (IEEE Trans. Instrum. Meas., 2025)