SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. - Vic De Ridder; Bappaditya Dey; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. - Vic De Ridder; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Stefan De Gendt; Bartel Van Waeyenberge (CoRR, 2023)

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. - Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. - Ying-Lin Chen; Jacob Deforce; Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002 (CoRR, 2024)

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. - Bappaditya Dey; Vic De Ridder; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2024)