Digital Instrumentation Calibration Using Computer Vision. - Fernando Martín Rodríguez; Esteban Vázquez-Fernández; Ángel Dacal-Nieto; Arno Formella; Víctor Álvarez-Valado; Higinio González-Jorge (ICIAR (2), 2010)

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope. - Higinio González-Jorge; Víctor Álvarez-Valado; Jose Luis Valencia; Soledad Torres (Sensors, 2010)