Accelerated testing for time dependent dielectric breakdown (TDDB) evaluation of embedded DRAM capacitors using tantalum pentoxide. - Anand Inani; Victor Koldyaev; Spencer Graves (Microelectron. Reliab., 2007)

A Novel Capacitorless DRAM Cell Design Using Band-Gap Engineered Junctionless Double-Gate FET. - Dheeraj Kumar Sinha; Amitabh Chatterjee; Vishnuram Abhinav; Gaurav Trivedi; Victor Koldyaev (VLSID, 2016)