Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs. - Gilles Gasiot; Dimitri Soussan; Jean-Luc Autran; Victor Malherbe; Philippe Roche (IRPS, 2015)

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis. - Victor Malherbe; Gilles Gasiot; Dimitri Soussan; Aurelien Patris; Jean-Luc Autran; Philippe Roche (IRPS, 2015)

Dose Effects and Mitigation in 28nm FD-SOI Advanced Interface Bus Chiplet Interconnect. - Antoine Rouget; Fady Abouzeid; Adrian Evans; Victor Malherbe; Aleksandra Chumakova; Philippe Roche; Fabien Clermidy (IOLTS, 2025)