A negative differential resistance effect implemented with a single MOSFET from 375 k down to 80 k. - Victor Vega-Gonzalez; Edmundo Gutierrez-Dominguez; Fernando Guarin (ESSDERC, 2013)

Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. - Alicja Lesniewska; Philippe J. Roussel; Davide Tierno; Victor Vega-Gonzalez; Marleen H. van der Veen; Patrick Verdonck; Nicolas Jourdan 002; Christopher J. Wilson; Zsolt Tökei; Kris Croes (IRPS, 2020)

Metal reliability mechanisms in Ruthenium interconnects. - Olalla Varela Pedreira; Michele Stucchi; Anshul Gupta; Victor Vega-Gonzalez; Marleen van der Veen; Stephane Lariviere; Christopher J. Wilson; Zsolt Tökei; Kristof Croes (IRPS, 2020)

Integration of a Stacked Contact MOL for Monolithic CFET. - Victor Vega-Gonzalez; D. Radisic; Bt Chan; S. Choudhury; S. Wang; A. Mingardi; Q. Toan Le; H. Decoster; Yusuke Oniki; P. Puttarame; Kevin Vandersmissen; J. P. Soulie; et al. (VLSI Technology and Circuits, 2023)

BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. - Y. Fang; Alicja Lesniewska; Ivan Ciofi; Philippe Roussel; Chen Wu; Victor Vega-Gonzalez; Ingrid De Wolf; Kris Croes (IRPS, 2024)

Monolithic Complementary Field Effect Transistors (CFET) Demonstrated using Middle Dielectric Isolation and Stacked Contacts. - Steven Demuynck; Victor Vega-Gonzalez; C. Toledo de Carvalho Cavalcante; L. Petersen Barbosa Lima; K. Stiers; C. Sheng; A. Vandooren; M. Hosseini; X. Zhou; Hans Mertens; Thomas Chiarella; Jürgen Bömmels; et al. (VLSI Technology and Circuits, 2024)