Embedded deterministic test points for compact cell-aware tests. - Cesar Acero; Derek Feltham; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee 001; Vidya Neerkundar; Marek Patyra; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (ITC, 2015)

On New Test Points for Compact Cell-Aware Tests. - Cesar Acero; Derek Feltham; Marek Patyra; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee 001; Vidya Neerkundar; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (IEEE Des. Test, 2016)

Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. - Sandeep Kumar Goel; Ankita Patidar; Moiz Khan; Frank Lee 004; Anshuman Chandra; Martin Keim; Naim Lemar; Jonathan Gaudet; Quoc Phan; Vidya Neerkundar (ITC, 2024)

From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel. - Brian Pajak; Pankaj Pant; Vidya Neerkundar (ITC, 2024)