Positive Bias Temperature Instability in Polysilicon/SiO2 PMOS Transistors for Analog High Precision Applications. - Dhanoop Varghese; Vijaya Vemuri; Arif Sonnet; Vijay Reddy; Srikanth Krishnan; Vivek Varier; Cheuk Yu; Srinivas Pulijala (IRPS, 2025)